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Apr 24, 2024
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EE 4260 Semiconductor Measurements and Characterization (3) Prereq.: consent of department. 2 hrs. lecture; 2 hrs. lab. Properties of semiconductor materials; their influence on device characteristics; bulk measurements such as resistivity, mobility, and lifetime; diffusion profiles and oxide layers; thin film characterization techniques; I-V and C-V measurements; emphasis on silicon.
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